Patents/Inventors

Jan Klusá{hacek Over (C)}ek

BrnoCZ3 patents

4 Patents

US119713722024
Method of Examining a Sample Using a Charged Particle Microscope
FEI Company
0 cites
US118154792023
Method of Examining a Sample Using a Charged Particle Beam Apparatus
FEI Company
0 cites
US117034682023
Method and System for Determining Sample Composition from Spectral Data
FEI Company
0 cites
US115987332023
Method of Examining a Sample Using a Charged Particle Microscope
FEI Company
0 cites